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MAL (Mask Auto-Label) for weakly-supervised segmentation. Produces segmentation masks from minimal annotations (point or box annotations) using a ViT-MAE backbone. Use when training, evaluating, or running inference for a TAO MAL model. Trigger phrases in Mask Grounding DINO for grounded instance segmentation. Extends Grounding DINO with a mask-prediction head for open-set segmentation guided by text prompts. Use when training, evaluating, exporting, quantizing, or running inference for a TAO Mask-Groundin Mask2Former for universal image segmentation (panoptic, instance, and semantic). Transformer-based with masked attention for high-quality segmentation results. Use when training, evaluating, exporting, quantizing, or running inference for a TAO Mask2Forme OneFormer for universal image segmentation. Unifies panoptic, instance, and semantic segmentation with a single architecture using task-conditioned queries. Use when training, evaluating, exporting, quantizing, or running inference for a TAO OneFormer mod SegFormer for semantic segmentation. Lightweight transformer-based architecture with hierarchical feature extraction, efficient for real-time segmentation tasks. Use when training, evaluating, exporting, quantizing, or running inference for a TAO SegForme Use when planning, executing, and independently validating Jetson Video Codec SDK or PyNvVideoCodec encode/decode, transcode, segmentation, container decode, AV1, or concise acceptance workflows. How to swap the DeepStream CV detection model in the VSS Alerts Blueprint verification (2d_cv) mode - covers ONNX export, custom bbox parsers, compose mount gotchas, nvinfer config, runtime TRT engine build, deployment, and a segmentation-capable model ad NVPanoptix3D for panoptic 3D scene reconstruction from posed RGB images. Produces 3D panoptic segmentation (semantic, instance, and panoptic masks) with occupancy completion. Built on a VGGT backbone with a Mask2Former-style head and 3D frustum reconstruc Visual ChangeNet for binary image classification and segmentation in AOI defect detection. Use when training, evaluating, exporting, or running inference for PCB defect detection or visual inspection, comparing image pairs for PASS/NO_PASS classification,
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